Physical Properties of Cu Doped ZnO Nanocrystiline Thin Films

Authors

Nada K. Abbas, Department of Physics, College of science for Women, University of Baghdad , Baghdad, Iraq.Follow
Zainab J. Shanan, Department of Physics, College of science for Women, University of Baghdad , Baghdad, Iraq.Follow
Teeba H. Mohammed, Department of Physics, College of science for Women, University of Baghdad , Baghdad, Iraq.Follow

Abstract

Thin films of ZnO nano crystalline doped with different concentrations (0, 6, 9, 12, and 18 )wt. % of copper were deposited on a glass substrate via pulsed laser deposition method (PLD). The properties of ZnO: Cu thin-nanofilms have been studied by absorbing UV-VIS, X-ray diffraction (XRD) and atomic force microscopes (AFM). UV-VIS spectroscopy was used to determine the type and value of the optical energy gap, while X-ray diffraction was used to examine the structure and determine the size of the crystals. Atomic force microscopes were used to study the surface formation of precipitated materials. The UV-VIS spectroscopy was used to determine the type and value of the optical energy gap.

Keywords

Atomic force microscopy (AFM), Pulsed laser deposition (PLD), X-raydiffraction (XRD), ZnO:Cu nano crystalline

Article Type

Article

How to Cite this Article

Abbas, Nada K.; Shanan, Zainab J.; and Mohammed, Teeba H. (2022) "Physical Properties of Cu Doped ZnO Nanocrystiline Thin Films," Baghdad Science Journal: Vol. 19: Iss. 1, Article 4.
DOI: https://doi.org/10.21123/bsj.2022.19.1.0217